JPH0524196Y2 - - Google Patents
Info
- Publication number
- JPH0524196Y2 JPH0524196Y2 JP18399586U JP18399586U JPH0524196Y2 JP H0524196 Y2 JPH0524196 Y2 JP H0524196Y2 JP 18399586 U JP18399586 U JP 18399586U JP 18399586 U JP18399586 U JP 18399586U JP H0524196 Y2 JPH0524196 Y2 JP H0524196Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- flat package
- light beam
- main body
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000007667 floating Methods 0.000 description 9
- 230000003287 optical effect Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18399586U JPH0524196Y2 (en]) | 1986-11-29 | 1986-11-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18399586U JPH0524196Y2 (en]) | 1986-11-29 | 1986-11-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6388743U JPS6388743U (en]) | 1988-06-09 |
| JPH0524196Y2 true JPH0524196Y2 (en]) | 1993-06-21 |
Family
ID=31131249
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18399586U Expired - Lifetime JPH0524196Y2 (en]) | 1986-11-29 | 1986-11-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0524196Y2 (en]) |
-
1986
- 1986-11-29 JP JP18399586U patent/JPH0524196Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6388743U (en]) | 1988-06-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3511450B2 (ja) | 光学式測定装置の位置校正方法 | |
| EP1840503B1 (en) | A component placement unit as well as a component placement device comprising such a component placement unit | |
| JP3427801B2 (ja) | 液位測定装置及び液位測定方法 | |
| US7043335B2 (en) | Mapping device | |
| JPH11257917A (ja) | 反射型光式センサ | |
| JPH09280859A (ja) | 傾斜センサ及びこれを使用した測量機 | |
| EP0006473A1 (en) | Gap measurement method | |
| JPH0243511A (ja) | イメージセンサ対の光学系との位置合わせ方法 | |
| JPH0524196Y2 (en]) | ||
| JPH0345322B2 (en]) | ||
| EP0019941B1 (en) | Reduction projection aligner system | |
| JPH11243129A (ja) | 半導体ウエハ位置検出装置 | |
| JPH06300541A (ja) | リードピン検査装置及び位置制御装置 | |
| JPH04268433A (ja) | 非球面レンズ偏心測定装置 | |
| JPH0682725B2 (ja) | フラツトパツケ−ジｉｃのリ−ドピン浮き状態検出方法 | |
| JP2565274B2 (ja) | 高さ測定装置 | |
| JPH08110212A (ja) | 電子部品用三次元測定装置 | |
| JPH0446371B2 (en]) | ||
| JP4201410B2 (ja) | 非接触薄膜検査装置 | |
| JPH02231513A (ja) | 集積回路素子のリード曲り検査方式 | |
| JPS6321509A (ja) | 測長装置 | |
| JPH05180642A (ja) | 平面物体の真直度測定機 | |
| JPH09222314A (ja) | リード検査方法及びリード検査装置 | |
| JP2001235308A (ja) | アライメント変動測定装置 | |
| JPH07198345A (ja) | 円径測定装置 |